CVE-2026-74439
Analyse NVD en cours
In the Linux kernel, the following vulnerability has been resolved: iommu/vt-d: Clear Present bit before tearing down scalable-mode context entry device_pasid_table_teardown() zeroes the 128-bit scalable-mode context entry with context_clear_entry() while the Present bit is still set. This creates a window where the hardware can fetch a torn entry, with some fields already zeroed while Present is still set, leading to unpredictable behavior or spurious faults. The context-cache invalidation is issued only after the entry has been zeroed, and intel_pasid_free_table() then frees the PASID directory pages, so the IOMMU can keep walking a stale Present=1 entry that points at freed memory. While x86 provides strong write ordering, the compiler may reorder the two 64-bit writes to the entry, and the hardware fetch is not guaranteed to be atomic with respect to multiple CPU writes. Commit c1e4f1dccbe9d ("iommu/vt-d: Clear Present bit before tearing down context entry") fixed this exact pattern in domain_context_clear_one() and the copied-context path, but device_pasid_table_teardown() was not converted. Align it with the "Guidance to Software for Invalidations" in the VT-d spec, Section 6.5.3.3, using the same ownership handshake as the sibling fix: clear only the Present bit, flush it to the IOMMU, perform the context-cache invalidation, and only then zero the rest of the entry.
Ce que ça veut dire
- Exposition
- Exploitable avec un accès local à la machine, sans authentification et sans action de la victime.
- Impact
- Un attaquant peut lire des données sensibles, modifier ou détruire des données et mettre le service hors ligne. L’atteinte déborde du composant vulnérable vers d’autres parties du système.
- Probabilité
- Le score EPSS reste bas : rien n’annonce une exploitation imminente, ce qui ne dispense pas de corriger.
À faireÀ corriger sans attendre le prochain cycle de correctifs.
Lecture automatique du vecteur CVSS, du type de faiblesse (CWE) et du score EPSS. La description technique ci-dessus reste celle publiée par le NIST, en anglais.