CVE-2026-74439
NVD analysis in progress
In the Linux kernel, the following vulnerability has been resolved: iommu/vt-d: Clear Present bit before tearing down scalable-mode context entry device_pasid_table_teardown() zeroes the 128-bit scalable-mode context entry with context_clear_entry() while the Present bit is still set. This creates a window where the hardware can fetch a torn entry, with some fields already zeroed while Present is still set, leading to unpredictable behavior or spurious faults. The context-cache invalidation is issued only after the entry has been zeroed, and intel_pasid_free_table() then frees the PASID directory pages, so the IOMMU can keep walking a stale Present=1 entry that points at freed memory. While x86 provides strong write ordering, the compiler may reorder the two 64-bit writes to the entry, and the hardware fetch is not guaranteed to be atomic with respect to multiple CPU writes. Commit c1e4f1dccbe9d ("iommu/vt-d: Clear Present bit before tearing down context entry") fixed this exact pattern in domain_context_clear_one() and the copied-context path, but device_pasid_table_teardown() was not converted. Align it with the "Guidance to Software for Invalidations" in the VT-d spec, Section 6.5.3.3, using the same ownership handshake as the sibling fix: clear only the Present bit, flush it to the IOMMU, perform the context-cache invalidation, and only then zero the rest of the entry.
What this means
- Exposure
- Exploitable with local access to the machine, without authentication and with no action from the victim.
- Impact
- An attacker can read sensitive data, modify or destroy data and take the service offline. The impact spreads beyond the vulnerable component into other parts of the system.
- Likelihood
- Its EPSS score stays low: nothing points to imminent exploitation, which is no reason to leave it unpatched.
What to doPatch without waiting for the next scheduled cycle.
Read automatically from the CVSS vector, the weakness type (CWE) and the EPSS score. The technical description above remains the one published by NIST.