CVE-2026-18220
NVD analysis in progress
An out-of-bounds write vulnerability was found in the BFD library's DLX ELF backend (bfd/elf32-dlx.c) in GNU binutils. The dlx_rtype_to_howto() function maps ELF relocation types to internal howto structures but fails to perform adequate bounds checking on attacker-controlled relocation type values (via ELF32_R_TYPE(r_info)) before indexing into the dlx_elf_howto_table[] array. The DLX relocation type number space is non-contiguous (basic types 0-6, extended types at 0x10000+), but the default case in the switch statement allows arbitrary index values to reach the array access. A specially crafted ELF/DLX object file can trigger this out-of-bounds write when processed by any BFD-consuming tool (objdump, readelf, strip, ld, nm, objcopy). The vulnerability has been demonstrated to achieve arbitrary code execution via a File Stream Oriented Programming (FSOP) attack against glibc FILE structures (stderr), redirecting control flow to system(). Attack scenarios include CI/CD pipelines performing automated binary analysis, developer workstations running objdump/readelf on untrusted binaries, automated security scanning or malware analysis tools invoking binutils, and package build systems processing third-party code. Note: This vulnerability is only exploitable when binutils is built with the DLX backend enabled (typically via --enable-targets=all).
What this means
- Exposure
- Exploitable with local access to the machine and without authentication — but only if a user opens booby-trapped content.
- Impact
- An attacker can read sensitive data, modify or destroy data and take the service offline.
- Weakness
- An out-of-bounds write corrupts neighbouring memory and often enables code execution.
- Likelihood
- Its EPSS score stays low: nothing points to imminent exploitation, which is no reason to leave it unpatched.
What to doFold into the next patch cycle.
Read automatically from the CVSS vector, the weakness type (CWE) and the EPSS score. The technical description above remains the one published by NIST.