CVE-2026-63950
NVD analysis in progress
In the Linux kernel, the following vulnerability has been resolved: mm/rmap: initialize nr_pages to 1 at loop start in try_to_unmap_one Initialize nr_pages to 1 at the start of each loop iteration, like folio_referenced_one() does. Without this, nr_pages computed by a previous folio_unmap_pte_batch() call can be reused on a later iteration that does not run folio_unmap_pte_batch() again. mmap a 64K large folio with MAP_ANONYMOUS | MAP_DROPPABLE, then call madvise(MADV_FREE), then make the last page device-exclusive via HMM_DMIRROR_EXCLUSIVE. Trigger node reclaim through sysfs. Now, in try_to_unmap_one(), we will first clear the first 15 out of 16 entries mapping the lazyfree folio. This will set nr_pages to 15. In the next pvmw walk, this nr_pages gets reused on a device-exclusive pte, thus potentially corrupting folio refcount/mapcount. At the moment, I have a userspace program which can make the kernel spit out a trace, but the blow up is in folio_referenced_one(), because there are existing bugs in the interaction between device-private and rmap (which too I am investigating). I did a one liner kernel change to avoid going into folio_referenced_one(), and the kernel blows up at folio_remove_rmap_ptes in try_to_unmap_one which is what I wanted. Note that the bug is there not since file folio batching but lazyfree folio batching, since device-exclusive only works for anonymous folios. Userspace visible effect is simply kernel crashing somewhere due to refcount/mapcount corruption.
What this means
- Exposure
- Exploitable with local access to the machine, with an ordinary user account and with no action from the victim.
- Impact
- An attacker can read sensitive data, modify or destroy data and take the service offline.
- Likelihood
- Its EPSS score stays low: nothing points to imminent exploitation, which is no reason to leave it unpatched.
What to doFold into the next patch cycle.
Read automatically from the CVSS vector, the weakness type (CWE) and the EPSS score. The technical description above remains the one published by NIST.