CVE-2026-64447
NVD analysis in progress
In the Linux kernel, the following vulnerability has been resolved: staging: media: ipu7: fix double-free and use-after-free in error paths In both ipu7_isys_init() and ipu7_psys_init(), pdata is allocated and then passed to ipu7_bus_initialize_device(), which stores it in adev->pdata. The ipu7_bus_release() function frees adev->pdata when the device's reference count drops to zero. Two error paths incorrectly call kfree(pdata) after the device teardown has already freed it: 1. When ipu7_mmu_init() fails: put_device() is called, which drops the reference count to zero and triggers ipu7_bus_release() -> kfree(pdata). The subsequent kfree(pdata) is a double-free. 2. When ipu7_bus_add_device() fails: it calls auxiliary_device_uninit() internally, which calls put_device() -> ipu7_bus_release() -> kfree(pdata). The subsequent kfree(pdata) is again a double-free. Note that the kfree(pdata) when ipu7_bus_initialize_device() itself fails is correct, because in that case auxiliary_device_init() failed and the release function was never set up, so pdata must be freed manually. Additionally, the error code was not saved before calling put_device(), causing ERR_CAST() to dereference the already-freed adev pointer when constructing the return value. Fix this by saving the error from dev_err_probe() before put_device() and returning ERR_PTR() instead. Remove the redundant kfree(pdata) calls and fix the use-after-free in the return values of the two affected error paths.
What this means
- Exposure
- Exploitable with local access to the machine, with an ordinary user account and with no action from the victim.
- Impact
- An attacker can read sensitive data, modify or destroy data and take the service offline.
- Likelihood
- Its EPSS score stays low: nothing points to imminent exploitation, which is no reason to leave it unpatched.
What to doFold into the next patch cycle.
Read automatically from the CVSS vector, the weakness type (CWE) and the EPSS score. The technical description above remains the one published by NIST.